Superconducting Microstrip Losses at Microwave and Submillimeter Wavelengths
Superconducting Microstrip Losses at Microwave and Submillimeter Wavelengths
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微波和亚毫米波长下的超导微带损耗
DOI：
10.1103/physrevapplied.16.014019
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发表时间：
2021
影响因子：
4.6
通讯作者：
J. Baselmans
中科院分区：
文献类型：
--
作者：
S. Hähnle;K. Kouwenhoven;B. Buijtendorp;A. Endo;K. Karatsu;D. Thoen;V. Murugesan;J. Baselmans
超导微带的介电损耗限制了超导集成器件在微波和亚毫米波波段的性能。然而，由于缺乏实验数据，我们目前对这些损失的理解是有限的，特别是在亚毫米波长。本研究提出了一种能够在两个波长范围内精确测量损耗的芯片。（Nb,Ti）N/$a$-Si/(Nb,Ti)N微带的数据显示，在亚毫米波段的损耗比在微波波段的损耗高得多，这不能用标准的两级系统模型来解释。该系统对于进一步探索这些损耗，以生产改进的器件非常有用。
Dielectric losses in superconducting microstrips often limit the performance of superconducting integrated devices at microwave and submillimeter wavelengths. Our current understanding of these losses is limited, though, especially at submillimeter wavelengths, due to a lack of experimental data. This study presents a chip that enables accurate loss measurements in both wavelength ranges. Data for a (Nb,Ti)N/$a$-Si/(Nb,Ti)N microstrip reveal much higher loss at submillimeter than at microwave wavelengths frequencies, which cannot be explained by the standard two-level-system model. This system should be very useful in further exploring these losses, to yield improved devices.
非晶硅两能级系统机械和介电损耗的起源
影响因子：
3.4
作者：
Molina-Ruiz, M.;Rosen, Y. J.;Jacks, H. C.;Abernathy, M. R.;Metcalf, T. H.;Liu, X.;DuBois, J. L.;Hellman, F.
通讯作者：
Hellman, F.