DNA methylation changes during long-term in vitro cell culture are caused by epigenetic drift.
DNA methylation changes during long-term in vitro cell culture are caused by epigenetic drift.
复制标题
DOI:
10.1038/s42003-021-02116-y
复制
发表时间:
2021-05-19
影响因子:
5.9
通讯作者:
Wagner W
中科院分区:
文献类型:
--
作者:
Franzen J;Georgomanolis T;Selich A;Kuo CC;Stöger R;Brant L;Mulabdić MS;Fernandez-Rebollo E;Grezella C;Ostrowska A;Begemann M;Nikolić M;Rath B;Ho AD;Rothe M;Schambach A;Papantonis A;Wagner W
Culture expansion of primary cells evokes highly reproducible DNA methylation (DNAm) changes. We have identified CG dinucleotides (CpGs) that become continuously hyper- or hypomethylated during long-term culture of mesenchymal stem cells (MSCs) and other cell types. Bisulfite barcoded amplicon sequencing (BBA-seq) demonstrated that DNAm patterns of neighboring CpGs become more complex without evidence of continuous pattern development and without association to oligoclonal subpopulations. Circularized chromatin conformation capture (4C) revealed reproducible changes in nuclear organization between early and late passages, while there was no enriched interaction with other genomic regions that also harbor culture-associated DNAm changes. Chromatin immunoprecipitation of CTCF did not show significant differences during long-term culture of MSCs, however culture-associated hypermethylation was enriched at CTCF binding sites and hypomethylated CpGs were devoid of CTCF. Taken together, our results support the notion that DNAm changes during culture-expansion are not directly regulated by a targeted mechanism but rather resemble epigenetic drift. Julia Franzen et al. investigate if changes in DNA methylation at specific genetic loci during cell culture expansion are due to a specific mechanism or gradual deregulation of an epigenetic state. Their results suggest that changes in CpG methylation are due to indirect epigenetic drift, rather than a consequence of targeting by DNA methyltransferases.
登录
查看更多内容
影响因子:
64.8
作者:
Dixon JR;Jung I;Selvaraj S;Shen Y;Antosiewicz-Bourget JE;Lee AY;Ye Z;Kim A;Rajagopal N;Xie W;Diao Y;Liang J;Zhao H;Lobanenkov VV;Ecker JR;Thomson JA;Ren B
通讯作者:
Ren B
影响因子:
5.9
作者:
Fernandez-Rebollo, Eduardo;Franzen, Julia;Wagner, Wolfgang
通讯作者:
Wagner, Wolfgang
影响因子:
64.5
作者:
Kim, Tae Hoon;Abdullaev, Ziedulla K.;Ren, Bing
通讯作者:
Ren, Bing
影响因子:
64.8
作者:
Guelen, Lars;Pagie, Ludo;van Steensel, Bas
通讯作者:
van Steensel, Bas
影响因子:
5.7
作者:
Hänzelmann S;Beier F;Gusmao EG;Koch CM;Hummel S;Charapitsa I;Joussen S;Benes V;Brümmendorf TH;Reid G;Costa IG;Wagner W
通讯作者:
Wagner W