Status and future aspects in nanoscale surface inspection of ferroics by scanning probe microscopy
Status and future aspects in nanoscale surface inspection of ferroics by scanning probe microscopy
复制标题
通过扫描探针显微镜检查铁磁性纳米级表面的现状和未来
DOI：
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发表时间：
2001
期刊：
影响因子：
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通讯作者：
R. Waser
中科院分区：
文献类型：
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作者：
L. Eng;F. Schlaphof;S. Trogisch;A. Roelofs;R. Waser
摘要铁电和铁弹材料纳米表征方法的不断需求明确地指向扫描探针仪器（SPM）的使用和实施。本文清楚地总结了解决扫描力显微镜（SFM）的实际可能性，以测量不同的表面特性，如表面化学成分，表面极化组成的内部和外部电场，三维极化分布，开关特性等，我们指出哪种方法是最适合的，以明确地记录所需的属性。然后，未来的发展趋势，纳米表面和散装检测与SPM制定。
Abstract The unbroken need of nanoscale characterisation methods for ferroelectric and ferroelastic materials unambiguously points towards the use and implementation of scanning probe instruments (SPM). This article clearly summarises the actual possibilities of addressing scanning force microscopy (SFM) in order to measure distinct surface properties like the surface chemical constitution, the surface polarisation making up the internal and external electric field, the 3-dimensional polarisation distribution, the switching properties, etc. We point out which method is best suited in order to unambiguously record the desired property. Then future trends in nanoscale surface and bulk inspection with SPM are formulated.