Characterization of large area avalanche photodiodes in X-ray and VUV-light detection
Characterization of large area avalanche photodiodes in X-ray and VUV-light detection
复制标题
X 射线和 VUV 光检测中大面积雪崩光电二极管的表征
DOI：
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发表时间：
2007
期刊：
影响因子：
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通讯作者：
J F C A Veloso
中科院分区：
文献类型：
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作者：
L M P Fernandes;F D Amaro;A Antognini;J M R Cardoso;C A N Conde;O Huot;P E Knowles;F Kottmann;J A M Lopes;L Ludhova;C M B Monteiro;F Mulhauser;R Pohl;J M F dos Santos;L A Schaller;D Taqqu;J F C A Veloso
本文综述了我们在大面积雪崩光电二极管（LAAPD）应用于X射线和真空紫外光探测方面的研究与开发工作。Advanced Photonix Inc.制造的LAAPD的操作特性。在室温下进行X射线检测。对于5.9 keV的X射线，在四个LAAPD中获得的最佳能量分辨率在10-18%的范围内。所观察到的变化与几个原型之间的暗电流差异有关。LAAPD已经展示了高计数率能力（高达约105/s）和在不同领域的适用性，主要是低能量X射线检测，其中选择用于低暗电流的LAAPD可以实现比比例计数器更好的性能。LAAPD也被研究作为真空紫外光传感器，呈现出与光电倍增管相比的优势。X射线通常用作光测量中的参考;这可能会受到X射线和VUV光测量的增益之间的非线性的影响。发现X射线的增益比VUV光低，特别是在较高的偏置电压下。对于5.9 keV的X射线，10%和6%的增益变化，测量相对于真空紫外光产生的氩（128 nm）和氙（172 nm）的增益约为200。研究了温度对LAAPD探测X射线和真空紫外光性能的影响。对于增益超过200的5.9 keV X射线，测量到每oC的增益变化超过-4%，而对于VUV光，每oC的增益变化大于-5%。发现能量分辨率随着温度的降低而提高，这主要归因于暗电流。过量的噪声因子，另一个贡献的能量分辨率，实验确定，并发现是独立的温度，线性增加与增益，从1.8到2.3为50-300增益范围。在高达5特斯拉的强磁场下的LAAPD响应进行了研究。虽然对于X射线检测，APD响应实际上不随磁场而变化，但对于172 nm VUV光，观察到超过20%的显著幅度减小。
The present manuscript reviews our R&D studies on the application of large area avalanche photodiodes (LAAPDs) to the detection of X-rays and vacuum ultraviolet (VUV) light. The operational characteristics of LAAPDs manufactured by Advanced Photonix Inc. were investigated for X-ray detection at room temperature. The optimum energy resolution obtained in four LAAPDs investigated was found to be in the range 10-18% for 5.9 keV X-rays. The observed variations are associated with dark current differences between the several prototypes. LAAPDs have demonstrated high counting rate capability (up to about 105/s) and applicability in diverse areas, mainly low-energy X-ray detection, where LAAPDs selected for low dark current may achieve better performance than proportional counters. LAAPDs were also investigated as VUV photosensors, presenting advantages compared to photomultiplier tubes. X-rays are often used as a reference in light measurements; this may be compromised by the non-linearity between gains measured for X-rays and VUV-light. The gain was found to be lower for X-rays than for VUV light, especially at higher bias voltages. For 5.9 keV X-rays, gain variations of 10% and 6% were measured relative to VUV light produced in argon ( ∼ 128 nm) and xenon ( ∼ 172 nm) for gains of about 200. The effect of temperature on the LAAPD performance was investigated for X-ray and VUV-light detection. Gain variations of more than -4% per oC were measured for 5.9 keV X-rays for gains above 200, while for VUV light variations are larger than -5% per oC. The energy resolution was found to improve with decreasing temperature, what is mainly attributed to dark current. The excess noise factor, another contribution to the energy resolution, was experimentally determined and found to be independent of temperature, increasing linearly with gain, from 1.8 to 2.3 for a 50-300 gain range. The LAAPD response under intense magnetic fields up to 5 Tesla was investigated. While for X-ray detection the APD response practically does not vary with the magnetic field, for 172 nm VUV light a significant amplitude reduction of more than 20% was observed.