Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images
Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images
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DOI：
10.1103/physrevlett.121.056101
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发表时间：
2018-07-30
影响因子：
8.6
通讯作者：
Van Aert, S.
中科院分区：
文献类型：
--
作者：
Fatermans, J.;den Dekker, A. J.;Van Aert, S.
单原子探测对于解决广泛的科学和技术问题至关重要。电子与物质的强烈相互作用使透射电子显微镜成为最有前途的技术之一。特别是，使用扫描透射电子显微镜的像差校正已经朝着检测单个原子迈出了重要的一步。然而，为了克服辐射损伤，与高能电子的使用有关，入射电子剂量应保持足够低。这导致图像显示出低信噪比和极弱的对比度，特别是对于轻元素纳米材料。为了克服这个问题，提出了一种基于物理的模型拟合和使用模型阶数选择方法的组合，使人们能够以高可靠性检测单个原子。
Single atom detection is of key importance to solving a wide range of scientific and technological problems. The strong interaction of electrons with matter makes transmission electron microscopy one of the most promising techniques. In particular, aberration correction using scanning transmission electron microscopy has made a significant step forward toward detecting single atoms. However, to overcome radiation damage, related to the use of high-energy electrons, the incoming electron dose should be kept low enough. This results in images exhibiting a low signal-to-noise ratio and extremely weak contrast, especially for light-element nanomaterials. To overcome this problem, a combination of physics-based model fitting and the use of a model-order selection method is proposed, enabling one to detect single atoms with high reliability.