Possible Polarization Measurements in Elastic Scattering at the Gamma Factory Utilizing a 2D Sensitive Strip Detector as Dedicated Compton Polarimeter
Possible Polarization Measurements in Elastic Scattering at the Gamma Factory Utilizing a 2D Sensitive Strip Detector as Dedicated Compton Polarimeter
复制标题
使用 2D 灵敏条形检测器作为专用康普顿旋光计，在伽玛工厂进行弹性散射中可能的偏振测量
DOI：
10.1002/andp.202100285
复制
发表时间：
2021
影响因子：
2.4
通讯作者：
T. Stöhlker
中科院分区：
文献类型：
--
作者：
W. Middents;G. Weber;U. Spillmann;T. Krings;M. Vockert;A. Volotka;A. Surzhykov;T. Stöhlker
对于从几个10 keV到几个MeV的光子能量，康普顿偏振测量是深入了解基本原子辐射过程的微妙细节的不可或缺的工具。在合作范围内，几个分段的半导体探测器被开发出来，非常适合作为有效的康普顿偏振计的应用。在这份报告中，这些最近的发展进行了审查，并讨论了如何康普顿旋光可以在即将到来的伽玛工厂。
For photon energies from several 10 keV up to a few MeV Compton polarimetry is an indispensable tool to gain insight into subtle details of fundamental atomic radiative processes. Within the SPARC collaboration several segmented semiconductor detectors are developed that are well suited for application as efficient Compton polarimeters. In this report, these recent developments are reviewed and it is discussed how Compton polarimetry can be employed at the upcoming Gamma Factory.