Full-wave analysis of conductor losses on MMIC transmission lines

Full-wave analysis of conductor losses on MMIC transmission lines
复制标题

MMIC 传输线上导体损耗的全波分析

DOI:
10.1109/mwsym.1989.38870
复制
发表时间:
1989
期刊:
IEEE MTT-S International Microwave Symposium Digest
影响因子:
--
通讯作者:
W. Heinrich
W. Heinrich
中科院分区:
--
文献类型:
--
作者:
W. Heinrich

文献摘要

被引文献

相似文献

提出了一种有耗平面传输线的模式匹配分析方法。金属层以与其余波导子区域相同的方式处理,其中每个金属层的特征在于其复介电常数。这导致一个完全自洽的描述导体损耗,提供了两个主要的优点相比,通常的扰动方法:该方法仍然有效的金属化尺寸的顺序或甚至小于趋肤深度,和非TEM(横向电磁)波导模式可以进行分析。扩展模式匹配方法的有效性和实用性,通过与以前的理论和实验工作的GaAs MMIC(单片微波集成电路)传输线的比较证明。微带线和槽线的第一个结果。&lt;<ETX>&gt;
A mode-matching analysis of lossy planar transmission lines is presented. The metallic layers are treated in the same way as the remaining waveguide subregions, with each of them characterized by its complex dielectric constant. This leads to a fully self-consistent description of the conductor losses that offers two principal advantages compared to the usual perturbation methods: the approach remains valid for metallization dimensions on the order of or even smaller than the skin depth, and non-TEM (transverse electromagnetic) waveguide modes can be analyzed. The validity and usefulness of the extended mode-matching method are demonstrated through a comparison with previous theoretical and experimental work on GaAs MMIC (monolithic microwave integrated circuit) transmission lines. First results on microstrip and slot lines are given.<<ETX>>