Effect of sample slope on image formation in scanning ion conductance microscopy.
Effect of sample slope on image formation in scanning ion conductance microscopy.
复制标题
样品斜率对扫描离子电导显微镜中图像形成的影响。
作者：
Denis Thatenhorst;J. Rheinlaender;T. Schäffer;I. Dietzel;Patrick Happel
扫描离子电导显微镜（SICM）是一种扫描探针技术，可用于研究复杂、复杂的样品表面，如损伤最小的活细胞。该技术通过电解质填充的微型或纳米移液管的小开口监测离子电流，该移液管接近浸没在电解质中的样品。电导以强烈的距离依赖性方式下降。对于SICM成像，假设相等电导变化的位置对应于相等的尖端-样品距离，因此可以用于重建样品表面。在这里，我们研究了这一假设，通过研究实验方法曲线对硅液滴，以及有限元建模的成像过程。我们发现，该假设是严格正确的，只有垂直的方法对水平样品，否则高估了样品的高度高达几个移液管开口半径。我们开发了一种方法来纠正这种高估，并将其应用于纠正固定细胞结构和活的整个细胞的图像。
Scanning ion conductance microscopy (SICM) is a scanning probe technique that allows investigating surfaces of complex, convoluted samples such as living cells with minimal impairment. This technique monitors the ionic current through the small opening of an electrolyte-filled micro- or nanopipet that is approached toward a sample, submerged in an electrolyte. The conductance drops in a strongly distance-dependent manner. For SICM imaging, the assumption is made that positions of equal conductance changes correspond to equal tip-sample distances and thus can be utilized to reconstruct the sample surface. Here, we examined this assumption by investigating experimental approach curves toward silicone droplets, as well as finite element modeling of the imaging process. We found that the assumption is strictly true only for perpendicular approaches toward a horizontal sample and otherwise overestimates the sample height by up to several pipet opening radii. We developed a method to correct this overestimation and applied it to correct images of fixed cellular structures and living entire cells.
影响因子：
7.4
作者：
Caldwell, Matthew;Del Linz, Samantha J. L.;Moss, Guy W. J.
通讯作者：
Moss, Guy W. J.
影响因子：
15
作者：
Clarke, Richard W.;Zhukov, Alexander;Klenerman, David
通讯作者：
Klenerman, David