SuReSim: simulating localization microscopy experiments from ground truth models
SuReSim: simulating localization microscopy experiments from ground truth models
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DOI：
10.1038/nmeth.3775
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发表时间：
2016-04-01
期刊：
影响因子：
48
通讯作者：
Kuner, Thomas
中科院分区：
文献类型：
--
作者：
Venkataramani, Varun;Herrmannsdoerfer, Frank;Kuner, Thomas
超分辨率荧光显微镜已成为许多研究领域广泛使用的工具。然而，设计和验证超分辨率实验以技术上可行和科学上严谨的方式解决研究问题仍然是一个根本性的挑战。我们开发了SuReSim，这是一个软件工具，可以模拟由地面真值模型表示的任意三维结构的定位数据，允许用户系统地探索改变实验参数如何影响潜在的成像结果。
Super-resolution fluorescence microscopy has become a widely used tool in many areas of research. However, designing and validating super-resolution experiments to address a research question in a technically feasible and scientifically rigorous manner remains a fundamental challenge. We developed SuReSim, a software tool that simulates localization data of arbitrary three-dimensional structures represented by ground truth models, allowing users to systematically explore how changing experimental parameters can affect potential imaging outcomes.