Fine-pitch glass GEM for high-resolution X-ray imaging
Fine-pitch glass GEM for high-resolution X-ray imaging
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用于高分辨率 X 射线成像的细间距玻璃 GEM
DOI：
10.1088/1748-0221/11/12/c12050
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发表时间：
2016
影响因子：
1.3
通讯作者：
Hiroyuki Toyokwara
中科院分区：
文献类型：
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作者：
Takeshi Fujiwara;Yuki Mitsuya;Hiroyuki Toyokwara
我们研制了一种用于高分辨率X射线成像的细间距玻璃气体电子倍增器（G-GEM）。细间距G-GEM由400 μm厚的可光蚀刻玻璃衬底制成，具有150 μm间距的孔。它是使用相同的湿蚀刻技术，为标准的G-GEM。在这项工作中，我们提出的实验结果与一个单一的细间距G-GEM与50× 50 mm 2的有效面积。当探测器被5.9 keV的X射线辐照时，我们记录到16.2%的能量分辨率和高达5,500的气体增益。我们提出了一个50× 50毫米2的X射线摄影图像采集的闪烁气体和光学读出系统。
We have developed a fine-pitch glass gas electron multiplier (G-GEM) for high-resolution X-ray imaging. The fine-pitch G-GEM is made of a 400 μm thick photo-etchable glass substrate with 150 μm pitch holes. It is fabricated using the same wet etching technique as that for the standard G-GEM. In this work, we present the experimental results obtained with a single fine-pitch G-GEM with a 50× 50 mm 2 effective area. We recorded an energy resolution of 16.2% and gas gain up to 5,500 when the detector was irradiated with 5.9 keV X-rays. We present a 50× 50 mm 2 X-ray radiograph image acquired with a scintillation gas and optical readout system.