Direct Measurement of the Binding Energy and Bohr Radius of a Single Hydrogenic Defect in a Semiconductor Quantum Well

Direct Measurement of the Binding Energy and Bohr Radius of a Single Hydrogenic Defect in a Semiconductor Quantum Well
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半导体量子阱中单个氢缺陷的结合能和玻尔半径的直接测量

DOI:
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发表时间:
2008
期刊:
Physical Review Letters 100
影响因子:
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通讯作者:
S.Perraud
S.Perraud
中科院分区:
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文献类型:
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作者:
Nakamura;T.;S.Perraud

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