A new Patterning method using photocatalytic lithography and selective atomic layer deposition
A new Patterning method using photocatalytic lithography and selective atomic layer deposition
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DOI:
10.1021/ja038769
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发表时间:
2004-01-14
影响因子:
15
通讯作者:
Sung, MM
中科院分区:
文献类型:
--
作者:
Lee, JP;Sung, MM
We report a new patterning method using photocatalytic lithography of alkylsiloxane self-assembled monolayers and selective atomic layer deposition of thin films. The photocatalytic lithography is based on the fact that the decomposition rate of the alkylsiloxane monolayers in contact with TiO2is much faster than that with SiO2under UV irradiation in air. The photocatalytic lithography, using a quartz plate coated with patterned TiO2thin films, was done to prepare patterned monolayers of the alkylsiloxane on Si substrates. A ZrO2thin film was selectively deposited onto the monolayer-patterned Si substrate by atomic layer deposition.