Quantitative measurement of short-range chemical bonding forces
Quantitative measurement of short-range chemical bonding forces
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DOI：
10.1126/science.1057824
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发表时间：
2001-03-30
期刊：
影响因子：
56.9
通讯作者：
Güntherodt, HJ
中科院分区：
文献类型：
--
作者：
Lantz, MA;Hug, HJ;Güntherodt, HJ
我们报告的直接力测量的化学键的形成。实验使用低温原子力显微镜、硅针尖和硅（111）7x7表面进行。测得的网站依赖的吸引力的短程力，达到最大值为2.1纳牛顿，是在一个类似的模型系统中的初始共价键的第一性原理计算的良好协议。的分辨率是足够的，以区分不等价的吸附原子之间的相互作用潜力的差异，证明了原子力显微镜的能力，提供定量的，原子尺度的表面化学反应性的信息。
We report direct force measurements of the formation of a chemical bond. The experiments were performed using a Low-temperature atomic force microscope, a silicon tip, and a silicon (111) 7x7 surface. The measured site-dependent attractive short-range force, which attains a maximum value of 2.1 nanonewtons, is in good agreement with first-principles calculations of an incipient covalent bond in an analogous model system. The resolution was sufficient to distinguish differences in the interaction potential between inequivalent adatoms, demonstrating the ability of atomic force microscopy to provide quantitative, atomic-scale information on surface chemical reactivity.