Decision tree based mismatch diagnosis in analog circuits
Decision tree based mismatch diagnosis in analog circuits
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DOI：
10.1109/vts.2006.26
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发表时间：
2006-04
期刊：
影响因子：
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通讯作者：
Mingjing Chen;H. Haggag;A. Orailoglu
中科院分区：
文献类型：
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作者：
Mingjing Chen;H. Haggag;A. Orailoglu
失配是模拟电路设计中的一个关键考虑因素。了解失配位置并了解其对电路性能的影响对于设计优化和工艺改进至关重要。我们在本文中提出了一种电路级失配诊断方法。将具有异常值的功能参数作为失配的表现进行测量，由此利用逆向追踪来确定失配源。该方法是在代表性基准上实施的，其效率通过模拟结果得到证实
Mismatch is a critical consideration in analog circuit design. Knowledge of mismatch locations and an understanding of their impact on circuit performance are crucial for design optimization and process improvement. We present a circuit level mismatch diagnosis methodology in this paper. The functional parameters with abnormal values are measured as manifestations of mismatch, from which reverse tracing is employed to determine the mismatch source. The methodology is implemented on a representative benchmark and its efficiency confirmed by simulation results