Raman investigation of lattice defects and stress induced in InP and GaN films by swift heavy ion irradiation
Raman investigation of lattice defects and stress induced in InP and GaN films by swift heavy ion irradiation
复制标题
快速重离子辐照在 InP 和 GaN 薄膜中引起的晶格缺陷和应力的拉曼研究
DOI：
10.1016/j.nimb.2016.01.031
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发表时间：
2016-04-01
影响因子：
1.3
通讯作者：
Hou, M. D.
中科院分区：
文献类型：
--
作者：
Hu, P. P.;Liu, J.;Hou, M. D.
InP crystals and GaN films were irradiated by swift heavy ions Kr-86 and Bi-209 with kinetic energies of 25 and 9.5 MeV per nucleon and ion fluence in the range 5 x 10(10) to 3.6 x 10(12) ions/cm(2). The characteristic optical bands were studied by Raman spectroscopy to reveal the disorder and defects induced in the samples during the irradiation process. The crystallinity of InP and GaN was found to be deteriorated after irradiation by the swift heavy ions and resulted in the amorphous nature of the samples along the ion tracks. The amorphous tracks observed by transmission electron microscopy (TEM) images confirmed the formation of lattice defects. In typical F-2(LO) mode, in case of InP, the spectra shifted towards the lower wavenumbers with a maximum shift of 7.6 cm(-1) induced by 1030 MeV Bi ion irradiation. While in case of GaN, the typical E-2(high) mode shifted towards the higher wavenumbers, with maximum shift of 5.4 cm(-1) induced by 760 MeV Bi ion irradiation at ion fluence of 1 x 10(12) ions/cm(2). The observed Raman shifts reveal the presence of lattice defects and disorder induced in the samples after irradiation by the swift heavy ions. This irradiation also generated lattice stress in the samples, which has been investigated and discussed in detail in this work. (C) 2016 Published by Elsevier B.V.
