Spin-valve-like magnetoresistance in a Ni-Mn-In thin film
Spin-valve-like magnetoresistance in a Ni-Mn-In thin film
复制标题
Ni-Mn-In 薄膜中的自旋阀式磁阻
DOI:
10.1103/physrevb.97.214427
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发表时间:
2018-06-25
影响因子:
3.7
通讯作者:
Li, Run-Wei
中科院分区:
文献类型:
--
作者:
Agarwal, Sandeep;Wang, Baomin;Li, Run-Wei
Spin valve devices, the resistive state of which is controlled by switching the magnetization of a free ferromagnetic layer with respect to a pinned ferromagnetic layer, rely on the scattering of electrons within the active medium to work. Here we demonstrate spin-valve-like effect in the Ni-Mn-In thin films, which consists of a ferromagnetic phase embedded in an antiferromagnetic matrix. Through transport and magnetic measurements, we confirm that scattering at the interfaces between the two phases gives rise to a unidirectional anisotropy and the spin-valve-like effect in this system. The magnitude of the spin-valve-like magnetoresistance (about 0.4% at 10 K) is stable within the temperature range of 10-400 K. The low- and high-resistance states cannot be destroyed even under a high magnetic field of 100 k Omega e. This finding opens up a way of realizing the spin valve effect in materials with competing ferromagnetic and antiferromagnetic interactions, where the interface between these phases acts as the active medium.