Scale‐Dependent Relationship between Wheat Yield and Topographic Indices
Scale‐Dependent Relationship between Wheat Yield and Topographic Indices
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DOI：
10.2136/sssaj2004.5770
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发表时间：
2004-03
影响因子：
2.9
通讯作者：
B. Si;R. Farrell
中科院分区：
文献类型：
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作者：
B. Si;R. Farrell
地形对作物产量有重大影响，因此更好地了解地形参数对作物产量的影响非常重要，特别是对于特定地点的土壤管理。本研究的目的是确定为水文研究开发的地形指数是否可以用作小波方法作物产量的指标。沿着加拿大萨斯喀彻温省粘壤土黑土（布莱恩湖协会）的样线，研究了丘陵地形中土壤曲率、上坡长度和湿度指数对小麦籽粒产量的影响。小波方法用于阐明作物产量与地形参数之间关系的潜在过程。小麦籽粒产量与上坡长度（R 2 = 0.60）和湿度指数（R 2 = 0.46）具有显着相关性，而土壤表面曲率仅解释了籽粒产量变化的15％。小波分析表明，小麦籽粒产量在<160 m的尺度上发生显着变化，上坡长度在280 m的尺度上发生显着变化，湿度指数在110 m的尺度上发生显着变化。交叉小波分析表明，在小于180 m的尺度上，小麦产量与上坡长度之间以及在小于140 m的尺度上，小麦产量与湿度指数之间存在显着的协方差，置信度为99%。
Topography can have a significant influence on crop yield, thus a better understanding of the effects of topographical parameters on crop yield is important-especially for site-specific soil management. The objective of this study was to determine whether topographical indices developed for hydrological studies could be used as indicators of crop yield using a wavelet approach. The effects of soil curvature, upslope length, and a wetness index on wheat grain yields in a hummocky terrain were investigated along a transect on a clay loam Black soil (Blaine Lake Association) in Saskatchewan, Canada. A wavelet approach was used to elucidate the processes underlying the relationships between crop yield and topographical parameters. Wheat grain yields had significant correlations with upslope length (R 2 = 0.60) and the wetness index (R 2 = 0.46), whereas soil surface curvature explained only 15% of the variations in grain yield. Wavelet analyses revealed that significant variations occurred at scales <160 m for wheat grain yield, 280 m for upslope lengths, and 110 m for the wetness index. The cross wavelet analysis indicated that significant covariance existed at scales <180 m between wheat grain yield and upslope lengths and at scales <140 m between wheat yield and the wetness index, at a 99% confidence level.