Dispersion of metal-insulator-metal plasmon polaritons probed by cathodoluminescence imaging spectroscopy
Dispersion of metal-insulator-metal plasmon polaritons probed by cathodoluminescence imaging spectroscopy
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DOI：
10.1103/physrevb.80.033409
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发表时间：
2009-07-01
影响因子：
3.7
通讯作者：
Polman, Albert
中科院分区：
文献类型：
--
作者：
Kuttge, Martin;Cai, Wei;Polman, Albert
阴极发光成像光谱被用来激发和表征的法布里-珀罗谐振器的表面等离子体激元的金属-绝缘体-金属（MIM）的几何形状限制的谐振模式。来自所观察到的模式图案的最小MIM等离子体激元波长被发现是160 nm的腔中具有10 nm的SiO2层的自由空间波长为645 nm。测得的波长与解析色散关系计算的值吻合得很好。激发几率的计算表明，MIM等离子体激元的共振激发强烈地依赖于电子能量，由于相位延迟效应所产生的有限的电子速度。
Cathodoluminescence imaging spectroscopy is used to excite and characterize the resonant modes of Fabry-Perot resonators for surface plasmon polaritons confined in a metal-insulator-metal (MIM) geometry. The smallest MIM plasmon wavelength derived from the observed mode pattern is found to be 160 nm in cavities with a 10 nm SiO2 layer for a free-space wavelength of 645 nm. The measured wavelength agrees well with values from analytical dispersion relation calculations. Calculations of the excitation probability show that the resonant excitation of MIM plasmons depends strongly on the electron energy due to phase retardation effects resulting from the finite electron velocity.