An equivalent network for resistance and temperature coefficient of resistance versus temperature and composition of thick resistive films
An equivalent network for resistance and temperature coefficient of resistance versus temperature and composition of thick resistive films
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电阻和电阻温度系数与温度和厚电阻膜成分的等效网络
DOI：
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发表时间：
1987
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影响因子：
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通讯作者：
A. Kusy
中科院分区：
文献类型：
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作者：
A. Kusy
厚电阻膜中的两种基本电阻被认为是：（i）由导电材料的体特性和收缩的几何形状决定的收缩电阻RC，以及（ii）由热激活类型的隧穿过程的参数和金属-绝缘体-金属单元的几何形状决定的势垒电阻RB。在此基础上，定义了由大量这两类电阻组成的电阻网络。从电阻和电阻温度系数（TCR）的角度出发，认为该网络等效于厚电阻膜（TRF）。该网络的参数已通过计算机辅助近似的实验数据，发现基于RuO 2的TRF进行了评估。根据导出的网络方程和近似结果，可以得出结论，网络TCR的小值是由导电电阻的TCR叠加而成的。
Two types of elementary resistances in thick resistive films have been considered: (i) constriction resistance RC determined by the bulk properties of conducting material and by the geometry of constriction, and (ii) barrier resistance RB determined by the parameters of a thermally activated type of tunneling process and by the geometry of the metal‐insulator‐metal unit. On this basis a resistance network composed of a large number of the two types of resistances has been defined. The network has been considered as being equivalent to thick resistive film (TRF) from the point of view of the resistance and temperature coefficient of resistance (TCR). The parameters of this network have been evaluated by the computer‐aided approximation of the experimental data found for RuO2‐based TRFs. On the basis of the equations derived for the network as well as the results of the approximation process, it can be concluded that the small values of the network TCR result from the superposition of the TCR of the conduct...