Evidence of graphitic AB stacking order of graphite oxides
Evidence of graphitic AB stacking order of graphite oxides
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DOI：
10.1021/ja076473o
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发表时间：
2008-01-30
影响因子：
15
通讯作者：
Lee, Young Hee
中科院分区：
文献类型：
--
作者：
Jeong, Hae-Kyung;Lee, Yun Pyo;Lee, Young Hee
采用简化的Brodie法制备了氧化石墨（GO）样品。羟基、环氧化物、羧基和一些烷基官能团存在于GO中，如通过固态C-13 NMR、傅里叶变换红外光谱和X射线光电子能谱所鉴定。从热解石墨（层间分离3.36埃）开始，反应1小时后的平均层间距离（通过X射线衍射测定）增加到5.62埃，然后随着进一步氧化增加到24小时后的7.37埃。与C-13 NMR中的信号相比，C-13 CPMAS NMR中较小的信号表明羧基和烷基位于氧化石墨薄片的边缘。从NMR和XPS数据的化学键合的其他方面进行了评估和讨论。从电子衍射研究推断出GO中的层的AB堆叠。进一步讨论了使用这种简化的Brodie方法制备的GO的元素组成。
Graphite oxide (GO) samples were prepared by a simplified Brodie method. Hydroxyl, epoxide, carboxyl, and some alkyl functional groups are present in the GO, as identified by solid-state C-13 NMR, Fourier-transform infrared spectroscopy, and X-ray photoemission spectroscopy. Starting with pyrolytic graphite (interlayer separation 3.36 angstrom), the average interlayer distance after 1 h of reaction, as determined by X-ray diffraction, increased to 5.62 angstrom and then increased with further oxidation to 7.37 angstrom after 24 h. A smaller signal in C-13 CPMAS NMR compared to that in C-13 NMR suggests that carboxyl and alkyl groups are at the edges of the flakes of graphite oxide. Other aspects of the chemical bonding were assessed from the NMR and XPS data and are discussed. AB stacking of the layers in the GO was inferred from an electron diffraction study. The elemental composition of GO prepared using this simplified Brodie method is further discussed.