Photoacoustic characterization of carbon nanotube array thermal interfaces
Photoacoustic characterization of carbon nanotube array thermal interfaces
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DOI：
10.1063/1.2510998
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发表时间：
2007-03-01
影响因子：
3.2
通讯作者：
Hu, Hanping
中科院分区：
文献类型：
--
作者：
Cola, Baratunde A.;Xu, Jun;Hu, Hanping
这项工作描述了利用光声技术（PA）对多壁碳纳米管（CNT）阵列界面，单面（Si-CNT-Ag）和双面（Si-CNT-CNT-Cu）的热传导进行的实验研究。利用等离子体增强化学气相沉积技术，在硅片和纯铜片上直接合成了锚定良好、致密、垂直定向的多壁碳纳米管阵列。利用PA技术，可以准确、精确地测量高导电性碳纳米管界面的小界面电阻。此外，PA技术可以解决单面碳纳米管界面组分电阻（Si-CNT和CNT- ag）和双面碳纳米管界面组分电阻（Si-CNT， CNT-CNT和CNT- cu），并可以估计碳纳米管层的热扩散率。在中等压力下，使用PA技术测量的单面和双面碳纳米管界面的热接触电阻分别为15.8 +/- 0.9和4.0 +/- 0.4 mm(2) K/W。这些结果与使用稳态一维参考条法得到的结果相比较有利；然而，不确定性的范围要窄得多。单侧碳纳米管热界面电阻主要由自由碳纳米管阵列尖端与其相对衬底（CNT- ag）之间的电阻决定，测量值为14.0 +/- 0.9 mm(2) K/W。双面碳纳米管热界面电阻主要由配合的碳纳米管阵列（CNT-CNT）的自由尖端之间的电阻决定，估计为2.1 +/- 0.4 mm(2) K/W。(c) 2007年美国物理学会。
This work describes an experimental study of thermal conductance across multiwalled carbon nanotube (CNT) array interfaces, one sided (Si-CNT-Ag) and two sided (Si-CNT-CNT-Cu), using a photoacoustic technique (PA). Well-anchored, dense, and vertically oriented multiwalled CNT arrays have been directly synthesized on Si wafers and pure Cu sheets using plasma-enhanced chemical vapor deposition. With the PA technique, the small interface resistances of the highly conductive CNT interfaces can be measured with accuracy and precision. In addition, the PA technique can resolve the one-sided CNT interface component resistances (Si-CNT and CNT-Ag) and the two-sided CNT interface component resistances (Si-CNT, CNT-CNT, and CNT-Cu) and can estimate the thermal diffusivity of the CNT layers. The thermal contact resistances of the one- and two-sided CNT interfaces measured using the PA technique are 15.8 +/- 0.9 and 4.0 +/- 0.4 mm(2) K/W, respectively, at moderate pressure. These results compare favorably with those obtained using a steady state, one-dimensional reference bar method; however, the uncertainty range is much narrower. The one-sided CNT thermal interface resistance is dominated by the resistance between the free CNT array tips and their opposing substrate (CNT-Ag), which is measured to be 14.0 +/- 0.9 mm(2) K/W. The two-sided CNT thermal interface resistance is dominated by the resistance between the free tips of the mating CNT arrays (CNT-CNT), which is estimated to be 2.1 +/- 0.4 mm(2) K/W. (c) 2007 American Institute of Physics.