Electron-Impact Ionization Time-of-Flight Mass Spectrometer for Molecular Beams,
Electron-Impact Ionization Time-of-Flight Mass Spectrometer for Molecular Beams,
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分子束电子轰击电离飞行时间质谱仪，
DOI：
10.1063/1.1139562
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发表时间：
1987
影响因子：
1.6
通讯作者：
R. B. Cohen
中科院分区：
文献类型：
--
作者：
J. Pollard;R. B. Cohen
描述了一种在分子束装置中进行电子轰击电离飞行时间质谱分析的方法。它为优化脉冲式或连续式喷嘴源的性能提供了一种便捷的手段，并且可与激光激发结合使用。质谱既可以以模拟波形产生，也可以在高重复率离子计数模式下产生。该装置还可作为一种快速电离真空计用于脉冲束的时间分辨检测。
A method is described for performing electron‐impact ionization time‐of‐flight mass spectrometry in a molecular beam apparatus. It provides a convenient means for optimizing the performance of pulsed or continuous nozzle sources and can be used in conjunction with laser excitation. Mass spectra are produced either as analog waveforms or in a high repetition rate ion counting mode. The device can also be operated as a fast ionization gauge for time‐resolved detection of pulsed beams.