Recovery of cycling-induced endurance failed HfOx based memristive devices by utilizing oxygen plasma treatment
Recovery of cycling-induced endurance failed HfOx based memristive devices by utilizing oxygen plasma treatment
复制标题
利用氧等离子体处理恢复循环引起的耐久性失效的 HfOx 忆阻器件
DOI：
10.1063/1.5120823
复制
发表时间：
2019
影响因子：
4
通讯作者：
Zheng Xuejun
中科院分区：
文献类型：
--
作者：
Wang Dong;Yan Shaoan;Chen Qilai;He Qiming;Li Gang;Xiao Yongguang;Tang Minghua;Zheng Xuejun
