Nanometer focusing of hard x rays by phase zone plates
Nanometer focusing of hard x rays by phase zone plates
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DOI：
10.1063/1.1149744
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发表时间：
1999-05
影响因子：
1.6
通讯作者：
W. Yun;B. Lai;Z. Cai;J. Maser;D. Legnini;E. Gluskin;Zheng Chen;A. Krasnoperova;Y. Vladimirsky;F. Cerrina;E. Fabrizio;M. Gentili
中科院分区：
文献类型：
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作者：
W. Yun;B. Lai;Z. Cai;J. Maser;D. Legnini;E. Gluskin;Zheng Chen;A. Krasnoperova;Y. Vladimirsky;F. Cerrina;E. Fabrizio;M. Gentili
聚焦的8 keV的X射线的光斑尺寸为150和90 nm的半高全宽已被证明在第一和第三阶焦点，分别为相位波带片（PZP）。PZP具有1.5 mrad的数值孔径和13%的聚焦效率为8 keV的X射线。在一阶焦点处获得了121 000的通量密度增益。本文介绍了PZP的制备方法和实验表征，并讨论了它的一些特殊应用。
Focusing of 8 keV x rays to a spot size of 150 and 90 nm full width at half maximum have been demonstrated at the first- and third-order foci, respectively, of a phase zone plate (PZP). The PZP has a numerical aperture of 1.5 mrad and focusing efficiency of 13% for 8 keV x rays. A flux density gain of 121 000 was obtained at the first-order focus. In this article, the fabrication of the PZP and its experimental characterization are presented and some special applications are discussed.