Advanced Electron Microscopy for Advanced Materials
Advanced Electron Microscopy for Advanced Materials
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DOI：
10.1002/adma.201202107
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发表时间：
2012-11
影响因子：
29.4
通讯作者：
G. van Tendeloo;S. Bals;S. Van Aert;J. Verbeeck;D. Van dyck
中科院分区：
文献类型：
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作者：
G. van Tendeloo;S. Bals;S. Van Aert;J. Verbeeck;D. Van dyck
这篇综述的目的是向材料科学界介绍先进电子显微镜新发展的可能性。在过去的十年里，电子显微镜已经发展成为一种完整的分析工具，能够提供原子尺度上的位置、性质甚至价原子的信息。这些信息通常是在二维（2D）中获得的，但现在也可以在3D中获得。我们展示了纳米粒子和界面领域的应用实例。
The idea of this Review is to introduce newly developed possibilities of advanced electron microscopy to the materials science community. Over the last decade, electron microscopy has evolved into a full analytical tool, able to provide atomic scale information on the position, nature, and even the valency atoms. This information is classically obtained in two dimensions (2D), but can now also be obtained in 3D. We show examples of applications in the field of nanoparticles and interfaces.