Current-induced magnetization switching in MgO barrier based magnetic tunnel junctions with CoFeB/Ru/CoFeB synthetic ferrimagnetic free layer
Current-induced magnetization switching in MgO barrier based magnetic tunnel junctions with CoFeB/Ru/CoFeB synthetic ferrimagnetic free layer
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DOI:
10.1143/jjap.45.l1057
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发表时间:
2006-10-01
期刊:
影响因子:
--
通讯作者:
Ohno, Hideo
中科院分区:
文献类型:
--
作者:
Hayakawa, Jun;Ikeda, Shoji;Ohno, Hideo
We report the intrinsic critical current density (J(c0)) in current-induced magnetization switching and the thermal stability factor (E/k(B)T, where E, k(B), and T are the energy potential, the Boltzmann constant, and temperature, respectively) in MgO based magnetic tunnel junctions with a Co40Fe40B20(2 nm)/Ru(0.7-2.4 nm)/Co40Fe40B20(2 nm) synthetic ferrimagnetic (SyF) free layer. We show that J(c0) and E/k(B)T can be determined by analyzing the average critical current density as a function of coercivity using the Slonczewski's model taking into account thermal fluctuation. We find that high antiferromagnetic coupling between the two CoFeB layers in a SyF free layer results in reduced J(c0) without reducing high E/k(B)T.