Current-induced magnetization switching in MgO barrier based magnetic tunnel junctions with CoFeB/Ru/CoFeB synthetic ferrimagnetic free layer

Current-induced magnetization switching in MgO barrier based magnetic tunnel junctions with CoFeB/Ru/CoFeB synthetic ferrimagnetic free layer
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DOI:
10.1143/jjap.45.l1057
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发表时间:
2006-10-01
期刊:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS
影响因子:
--
通讯作者:
Ohno, Hideo
Ohno, Hideo
中科院分区:
其他
文献类型:
--
作者:
Hayakawa, Jun;Ikeda, Shoji;Ohno, Hideo

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我们报告了电流感生磁化翻转中的本征临界电流密度(J(c 0))和热稳定因子(E/k(B)T,其中E、k(B)和T是势能、玻尔兹曼常数和温度,分别)在具有Co 40 Fe 40 B20(2纳米)/Ru(0.7-2.4纳米)/Co 40 Fe 40 B20(2纳米)合成铁磁(SyF)自由层的MgO基磁性隧道结中。我们表明,J(c 0)和E/k(B)T可以通过分析的平均临界电流密度作为一个函数的磁化率使用Slonczewski的模型,考虑到热波动。我们发现,在SyF自由层中,两个CoFe B层之间的高反铁磁耦合导致J(c 0)降低,而不降低高E/k(B)T。
We report the intrinsic critical current density (J(c0)) in current-induced magnetization switching and the thermal stability factor (E/k(B)T, where E, k(B), and T are the energy potential, the Boltzmann constant, and temperature, respectively) in MgO based magnetic tunnel junctions with a Co40Fe40B20(2 nm)/Ru(0.7-2.4 nm)/Co40Fe40B20(2 nm) synthetic ferrimagnetic (SyF) free layer. We show that J(c0) and E/k(B)T can be determined by analyzing the average critical current density as a function of coercivity using the Slonczewski's model taking into account thermal fluctuation. We find that high antiferromagnetic coupling between the two CoFeB layers in a SyF free layer results in reduced J(c0) without reducing high E/k(B)T.