Robust atomic resolution imaging of light elements using scanning transmission electron microscopy
Robust atomic resolution imaging of light elements using scanning transmission electron microscopy
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DOI：
10.1063/1.3265946
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发表时间：
2009-11-09
影响因子：
4
通讯作者：
Ikuhara, Y.
中科院分区：
文献类型：
--
作者：
Findlay, S. D.;Shibata, N.;Ikuhara, Y.
我们表明，放置在扫描透射电子显微镜中的亮场锥内的环形检测器可以直接成像的晶体中的轻元素。与常见的高角度环形暗场成像相比，轻和重原子柱同时可见。与常见的明场成像相比，图像在大范围的厚度上是直接和鲁棒的可解释的。我们通过系统的模拟证明了这一点，并提出了一个简单的物理模型，以获得一些洞察力的散射动力学（C）2009年美国物理研究所。[doi：10.1063/1.3265946]
We show that an annular detector placed within the bright field cone in scanning transmission electron microscopy allows direct imaging of light elements in crystals. In contrast to common high angle annular dark field imaging, both light and heavy atom columns are visible simultaneously. In contrast to common bright field imaging, the images are directly and robustly interpretable over a large range of thicknesses. We demonstrate this through systematic simulations and present a simple physical model to obtain some insight into the scattering dynamics (C) 2009 American Institute of Physics. [doi:10.1063/1.3265946]