Dielectric properties and microstructures of non-reducible high-temperature stable X9R ceramics
Dielectric properties and microstructures of non-reducible high-temperature stable X9R ceramics
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DOI:
10.1016/j.jeurceramsoc.2013.02.021
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发表时间:
2013-09
影响因子:
5.7
通讯作者:
Sea-Fue Wang;Jian-Hua Li;Y. Hsu;Yu-Chuan Wu;Yuanming Lai;Minghua Chen
中科院分区:
文献类型:
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作者:
Sea-Fue Wang;Jian-Hua Li;Y. Hsu;Yu-Chuan Wu;Yuanming Lai;Minghua Chen
New X9R dielectrics based on the precursors of (1−x) BaTiO3–xLiTaO3(BT–xLT) compositions and containing no lead and bismuth constituents were successfully prepared in this study. After sintering at 1150–1250°C in a reducing atmosphere of 97%N2–3%H2, major phases including BaTiO3and Ba2LiTa5O15and a minor phase of Li2TiO3were identified in the sintered ceramics. The intensities of the XRD peaks corresponding to the Ba2LiTa5O15phase rose with the increasing x value in the precursors. The grain sizes of the sintered ceramics appeared to fall in the range between 0.3 and 0.5μm and slightly increased with the x value of the BT–xLT ceramics. The best composition in term of dielectric properties was found in the BT–0.25LT ceramic, which was marked with a dielectric constant of 895, tanδ of 1.01% and 7.1%, TCCs of −3.04% and −14.80%, and electrical resistivities of 9.9×1012and 1.6×1012Ωcm, respectively at 25°C and 200°C.