A Novel Technique for Accurate Intensity Calibration of Area X-ray Detectors at Almost Arbitrary Energy.
A Novel Technique for Accurate Intensity Calibration of Area X-ray Detectors at Almost Arbitrary Energy.
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一种在几乎任意能量下精确校准区域 X 射线探测器强度的新技术。
DOI：
10.1107/s0909049595013574
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发表时间：
1996
影响因子：
2.5
通讯作者：
S. McSweeney
中科院分区：
文献类型：
--
作者：
J. Moy;A. Hammersley;S. O. Svensson;A. Thompson;K. Brown;L. Claustre;A. González;S. McSweeney
提出了一种新的面阵X射线探测器强度均匀性校准方法。在衍射实验中，含有掺杂元素的非晶锂玻璃板，其K边缘刚好低于主光束的能量，取代晶体样品进行校准测量。由X射线束激发的荧光发射几乎是各向同性的。它具有与衍射辐射完全相同的几何形状，并且可以通过适当选择元素和激发能量在相同波长处获得。样品2 theta扫描允许发射分布作为角度的函数以百分之几的精度表征。这允许类似精度的平场校正。采用掺锶四硼酸锂玻璃进行平场校正，显著提高了X射线图像增强器/CCD探测器收集的晶体学数据的质量。该技术可应用于5至50 KeV的X射线能量;校准样品体积小、稳定且易于处理。
A novel intensity uniformity calibration method for area X-ray detectors is described. In diffraction experiments, amorphous lithium glass plates, containing doping elements chosen for their K edges just below the energy of the main beam, replace the crystallographic samples for the calibration measurement. The fluorescent emission excited by the X-ray beam is almost isotropic. It has exactly the same geometry as the diffracted radiation, and can be obtained at the same wavelength by proper selection of the element and excitation energy. A sample 2theta scan allows the emission distribution as a function of angle to be characterized with an accuracy of a fraction of a percent. This allows a flat-field correction of similar accuracy. The quality of crystallographic data collected with an X-ray image intensifier/CCD detector was significantly improved by flat-field correction using an Sr-doped lithium tetraborate glass. This technique can be applied to X-ray energies from 5 to 50 KeV; the calibration sample is small, stable and easily handled.