Contrast Transfer and Noise Minimization in Electron Ptychography
Contrast Transfer and Noise Minimization in Electron Ptychography
复制标题
电子叠印术中的对比度传递和噪声最小化
DOI：
10.1017/s1431927619001053
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发表时间：
2019
影响因子：
2.8
通讯作者：
P. Nellist
中科院分区：
文献类型：
--
作者：
C. O’Leary;G. Martinez;E. Liberti;M. Humphry;A. Kirkland;P. Nellist
使用快速像素化探测器（FPD）的电子重叠关联成像的发展使得能够以原子分辨率对轻元素晶体和准晶体结构进行局部高对比度成像。因此，轻元素和重元素的同步图像可以从同一个实验中常规地获得[1]。然而，这种方法的应用程序更复杂的材料与长程有序，其中许多是敏感的电子束，已较少报道。自从低温电子显微镜在生物学应用中取得成功以来，这一研究领域就变得更加相关。
The development of electron ptychography using fast pixelated detectors (FPDs) has enabled localized high contrast imaging of light-element crystalline and quasi-crystalline structures at atomic resolution. As a result, simultaneous images of lightand heavy-elements can be routinely obtained from the same experiment [1]. However, the application of such methods to more complex materials with longer-range ordering, many of which are sensitive to the electron beam, has been less frequently reported. This area of research is ever more pertinent since the success of cryo-electron microscopy for biological applications.