Electroluminescence Transients at ZnO-Electrodes by Hole Injection during Persulfate Reduction
Electroluminescence Transients at ZnO-Electrodes by Hole Injection during Persulfate Reduction
复制标题
过硫酸盐还原过程中空穴注入 ZnO 电极的电致发光瞬态
DOI：
10.1002/bbpc.19830870416
复制
发表时间：
1983
期刊：
影响因子：
--
通讯作者：
H. Gerischer
中科院分区：
文献类型：
--
作者：
T. Yamase;H. Gerischer
研究了过硫酸盐脉冲还原过程中 ZnO-电解质界面处的电致发光瞬态。发射光的光谱分布以带隙能量为中心，表明中间形成的 SO4- 自由基的空穴注入以及与电子的连续辐射复合。阴极电流脉冲期间光子发射的衰减归因于析氢和阴极晶体分解形成复合中心。这些中心可以是结构缺陷、ZnO 表面上的 Zn 原子或吸附在表面上并且也可能并入晶格中的 H 原子。
Electroluminescence transients at the ZnO-electrolyte interface have been studied during pulsed reduction of persulfate. The spectral distribution of the emitted light centers around the band gap energy and indicates hole injection from the intermediately formed SO4- radicals and consecutive radiative recombination with electrons. The decay in the photon emission during a cathodic current pulse is attributed to the formation of recombination centers by hydrogen evolution and cathodic crystal decomposition. Such centers can be structural defects, Zn-atoms on the ZnO surface or H-atoms adsorbed on the surface and possibly also incorporated into the crystal lattice.