Microwave Dielectric Properties of CuO-V2O5-Bi2O3-Doped ZnNb2O6 Ceramics with Low Sintering Temperature
Microwave Dielectric Properties of CuO-V2O5-Bi2O3-Doped ZnNb2O6 Ceramics with Low Sintering Temperature
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DOI:
10.1007/s10832-005-6586-0
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发表时间:
2005
影响因子:
1.7
通讯作者:
Y. Zhang;Zhenxing Yue;Z. Gui;L. Li
中科院分区:
文献类型:
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作者:
Y. Zhang;Zhenxing Yue;Z. Gui;L. Li
Microwave dielectric properties of low temperature sintering ZnNb2O6ceramics doped with CuO-V2O5-Bi2O3additions were investigated systematically. The co-doping of CuO, V2O5and Bi2O3can significantly lower the sintering temperature of ZnNb2O6ceramics from 1150 to 870∘C. The secondary phase containing Cu, V, Bi and Zn was observed at grain boundary junctions, and the amount of secondary phase increased with increasing CuO-V2O5-Bi2O3content. The dielectric properties at microwave frequencies (7–9 GHz) in this system exhibited a significant dependence on the relative density, content of additives and microstructure of the ceramics. The dielectric constant (εr) of ZnNb2O6ceramics increased from 21.95 to 24.18 with increasing CuO-V2O5-Bi2O3additions from 1.5 to 4.0 wt%. The quality factors (Q×f) of this system decreased with increasing CuO-V2O5-Bi2O3content and ranged from 36118 to 67100 GHz for sintered ceramics, furthermore, allQ×fvalues of samples with CuO-V2O5-Bi2O3additions are lower than that of un-doped ZnNb2O6ceramics sintered at 1150∘C for 2 h. The temperature coefficient of resonant frequency (τf) changed from −33.16 to −25.96 ppm/∘C with increasing CuO-V2O5-Bi2O3from 1.5 to 4.0 wt%