Proceedings Design, Automation and Test in Europe Conference and Exhibition
Proceedings Design, Automation and Test in Europe Conference and Exhibition
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欧洲会议及展览设计、自动化和测试论文集
DOI:
10.1109/date.2003.1253577
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发表时间:
2003
期刊:
影响因子:
--
通讯作者:
M. Bushnell
中科院分区:
文献类型:
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作者:
Keerthi Heragu;V. Agrawal;M. Bushnell
The following topics are dealt with: ambient intelligence - visions and achievements; energy-efficient memory systems; uncertainty; power-aware design and synthesis; test data compression; operating system abstraction and targeting; embedded software forum; analysis of jitter and noise for analogue systems; semiconductor device modelling and simulation; embedded system scheduling and analysis; DFT and BIST recent advances; analogue and RF modelling, simulation and optimisation; architectural level synthesis; scheduling in reconfigurable computing; delay testing and diagnosis; embedded operating systems for SoC; networks-on-chip; system level modelling; reconfigurable SoC; analogue and defect-oriented testing; energy aware software techniques; interconnect modelling and signal integrity; system level simulation; software optimisation; global approaches to layout synthesis; platform design and IP reuse methods; on-line testing and self-repair; safe automotive software development; mixed-signal design techniques; low power architectures; SoC testing; SAT based verification; highly integrated communication systems; chip estate zoning; asynchronous circuits; collaborative design and WWW-based tools; hardware/software codesign optimization; test pattern generation; low power software; application specific memory synthesis; CAD.