Nanotube manipulation with focused ion beam
Nanotube manipulation with focused ion beam
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DOI：
10.1063/1.2161395
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发表时间：
2006-01
影响因子：
4
通讯作者：
Zhifeng Deng;E. Yenilmez;A. Reilein;J. Leu;H. Dai;K. Moler
中科院分区：
文献类型：
--
作者：
Zhifeng Deng;E. Yenilmez;A. Reilein;J. Leu;H. Dai;K. Moler
我们展示了用聚焦离子束拉直和排列金属涂层碳纳米管的能力。金属涂覆的纳米管朝向离子束源排列，允许它们的方向以精确的角度改变。通过这种技术，可以制备出几微米长的金属涂层纳米管尖端，用于扫描探针显微镜。我们使用这些尖端对细胞表面的高纵横比结构进行成像。
We demonstrate the ability to straighten and align metal-coated carbon nanotubes with a focused ion beam. The metal-coated nanotubes align toward the source of the ion beam allowing their orientation to be changed at precise angles. By this technique, metal-coated nanotube tips that are several micrometers in length are prepared for scanning probe microscopy. We image high-aspect-ratio structures on the surface of a cell using these tips.