Anomalous Ionization Regime in a Forced Electron Beam Induced Arc Discharge Ion Source for Singly Charged Radioactive Ion Beam Production
Anomalous Ionization Regime in a Forced Electron Beam Induced Arc Discharge Ion Source for Singly Charged Radioactive Ion Beam Production
复制标题
用于单电荷放射性离子束生产的强制电子束诱导电弧放电离子源中的反常电离机制
DOI：
10.1088/1742-6596/2244/1/012074
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发表时间：
2022
期刊：
影响因子：
--
通讯作者：
A. Gottberg
中科院分区：
文献类型：
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作者：
F. Maldonado Millán;C. Babcock;T. Day Goodacre;A. Gottberg
在TRIUMF的ISAC设施中，惰性气体、卤素和分子的1+放射性离子束（RIBs）使用强制电子束诱导电弧放电（FEBIAD）离子源产生。报道的FEBIAD的电离效率范围为10%至25%，而TRIUMF-FEBIAD的电离效率似乎< 1%，90%发射度<15 μm。由于RIB离子源的目标是高电离效率，因此进行了实验和数值活动以研究所观察到的低效率。40 Ar+的实验结果表明，高达10%的电离效率是可能的，通过操作源在不同的参数。测量结果与理论估计一致;然而，某些参数的组合会产生非常高的电子电流，使电离效率提高三倍。目前的调查旨在表征和建模的异常电子电流，因为，如果被证明是可靠的，氩离子化效率可以达到30%，没有显着的影响束发射度。
At TRIUMF’s ISAC facility, 1+ Radioactive Ion Beams (RIBs) of noble gases, halogens, and molecules are created using a Forced Electron Beam Induced Arc Discharge (FEBIAD) ion source. Reported ionization efficiencies for FEBIADs range from 10% to 25% for 40Ar+, while TRIUMF-FEBIAD ionization efficiency seems to be < 1% with a 90% emittance <15 μm. As RIB ion sources aim for a high ionization efficiency, an experimental and numerical campaign was conducted to investigate the comparably low efficiencies observed. The experimental results for 40Ar+ indicate that up to a 10% ionization efficiency is possible by operating the source at different parameters. The measurements agree with theoretical estimations; however, certain combinations of parameters produce an anomalously high electron current which enhances the ionization efficiency threefold. Present investigations aim to characterize and model the anomalous electron current because, if proven reliable, the argon ionization efficiency could reach 30% with no significant impact on beam emittance.