Thick Epitaxial YIG Films with Narrow FMR Linewidth
Thick Epitaxial YIG Films with Narrow FMR Linewidth
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DOI：
10.4028/www.scientific.net/ssp.200.250
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发表时间：
2012-09
期刊：
影响因子：
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通讯作者：
I. Syvorotka;I. Syvorotka;S. Ubizskii
中科院分区：
文献类型：
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作者：
I. Syvorotka;I. Syvorotka;S. Ubizskii
The La-doped yttrium iron garnet (YIG) films with thickness up to 130 μm were grown by liquid phase epitaxy (LPE) method. All grown thick films demonstrate “mirror” and “striation” types of surface morphology that depend from film growth temperature and thickness. Addition of B2O3 is favourable to a change the surface morphology into a “mirror” one. The mechanisms of the morphological changes are discussed. It was found that the ferromagnetic resonance (FMR) linewidth appreciably depends from surface morphology of grown films. For thick films with “mirror” surface the FMR linewidth is less than 0.8 Oe and more than ten times less in comparison with films with “striation” surface.
