Tungsten bronze-structured temperature-stable dielectrics

Tungsten bronze-structured temperature-stable dielectrics
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DOI:
10.1111/j.1551-2916.2007.01487.x
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发表时间:
2007-03
影响因子:
3.9
通讯作者:
M. Stennett;I. Reaney;G. C. Miles;A. West;C. Kirk
M. Stennett;I. Reaney;G. C. Miles;A. West;C. Kirk
中科院分区:
材料科学2区
文献类型:
--
作者:
M. Stennett;I. Reaney;G. C. Miles;A. West;C. Kirk

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基于钨青铜结构的BaO-M_2 O_3-TiO_2-Nb_2 O_5(BMTN,M= La ~(3+),Nd ~(3+),Sm ~(3+))体系,制备了具有优异温度稳定性的多层电容器用介质材料。BLTN、BNTN和BCN端元基团的非均相混合物已用于制造陶瓷电容器,该陶瓷电容器在−50° C和+ 200°C之间稳定至室温电容的−15%(Δ r>300),在1 MHz时室温介电损耗<0.02。
Dielectrics with exceptional temperature stability suitable for multilayer capacitor applications have been fabricated based on compositions in the tungsten bronze-structured BaO–M2O3–TiO2–Nb2O5 (BMTN, M=La3+, Nd3+, Sm3+) system. Heterogeneous mixtures of BLTN, BNTN, and BSTN end members groups have been used to manufacture a ceramic capacitor stable to −15% of the room temperature capacitance (ɛr>300) between −50° and + 200°C, with a room temperature dielectric loss of <0.02 at 1 MHz.