Holographic scattering in SiO2 nanoparticle-dispersed photopolymer films

Holographic scattering in SiO2 nanoparticle-dispersed photopolymer films
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DOI:
10.1364/ao.46.006809
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发表时间:
2007-09-20
期刊:
影响因子:
1.9
通讯作者:
Tomita, Yasuo
Tomita, Yasuo
中科院分区:
工程技术4区
文献类型:
--
作者:
Suzuki, Naoaki;Tomita, Yasuo

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我们描述了由记录在二氧化硅纳米粒子分散的光聚合物薄膜中的寄生噪声光栅引起的全息(相干)散射的实验研究。评估了薄膜厚度和纳米粒子浓度对全息散射损失的依赖关系。结果表明,在双光束记录装置中,全息散射图的几何特征可以用Ewald球结构来解释。结果发现,当纳米粒子浓度大于10vol.%的薄膜厚度大于100um m时,全息散射变得明显,并讨论了全息散射在纳米粒子分散的厚(100um M)光聚合物薄膜中记录的体栅特性中的重要意义。(C)2007年美国光学学会。
We describe an experimental study of holographic (coherent) scattering due to parasitic noise gratings recorded in SiO2 nanoparticle-dispersed photopolymer films. Dependences of film thickness and nanoparticle concentration on holographic scattering losses are evaluated. It is shown that the geometric feature of the holographic scattering pattern in the two-beam recording setup can be explained by the Ewald sphere construction. It is found that holographic scattering becomes noticeable when a film with nanoparticle concentrations higher than 10 vol.% is thicker than 100 mu m. The significance of holographic scattering in the characterization of a volume grating recorded in a thick (>100 mu m) nanoparticle-dispersed photopolymer film is also discussed. (C) 2007 Optical Society of America.