HIGH-RESOLUTION TOMOGRAPHY WITH CHEMICAL SPECIFICITY

HIGH-RESOLUTION TOMOGRAPHY WITH CHEMICAL SPECIFICITY
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DOI:
10.1016/0168-9002(86)90167-1
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发表时间:
1986-05-15
影响因子:
1.4
通讯作者:
KINNEY, J
KINNEY, J
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
BONSE, U;JOHNSON, Q;KINNEY, J

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描述了一种非常快速的计算机临界吸收断层扫描方法,具有约 10 μm 的空间分辨率和高化学灵敏度。使用同步辐射,该方法特别适合研究小样本。初步实验发现,在中等原子序数下,仅 0.2 μm 厚的相邻元素层即可被区分。
A very fast method of computerized critical absorption tomography featuring ∼ 10 μm spatial resolution and high chemical sensitivity is described. Synchrotron radiation is used and the method is especially suited to investigating small samples. From a preliminary experiment it is found that layers of neighboring elements only 0.2 μm thick can be distinguished at medium atomic numbers.