Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics
Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics
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放射性示踪剂测量作为检测基于分子的有机电子器件中金属渗透的灵敏工具
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发表时间：
2005
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通讯作者：
J. Pflaum
中科院分区：
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作者：
M. Scharnberg;Jing;J. Kanzow;K. Rätzke;R. Adelung;F. Faupel;C. Pannemann;U. Hilleringmann;S. Meyer;J. Pflaum
有机薄膜的金属化是分子电子学发展的关键点。然而，目前还没有建立检测这些薄膜中痕量金属原子的方法。放射性示踪剂测量甚至可以量化渗入主体的极少量材料，在我们的例子中小于单层的 0.01%。在这里，演示了该技术在两种不同的良好表征的有机薄膜系统（二茚并苝和并五苯）上的应用。结果表明，Ag 主要吸附在表面，但表明在适当的沉积温度下，Ag 可以渗透到有机薄膜中并在薄膜/基底界面处聚集。
The metallization of organic thin films is a crucial point in the development of molecular electronics. However, there is no method established yet to detect trace amounts of metal atoms in those thin films. Radiotracer measurements can quantify even very small amounts of material penetrating into the bulk, in our case less than 0.01% of a monolayer. Here, the application of this technique on two different well-characterized organic thin film systems (diindenoperylene and pentacene) is demonstrated. The results show that Ag is mainly adsorbed on the surface, but indicate that already at moderate deposition temperatures Ag can penetrate into the organic thin films and agglomerate at the film/substrate interface.