Three-dimensional super-resolution high-throughput imaging by structured illumination STED microscopy
Three-dimensional super-resolution high-throughput imaging by structured illumination STED microscopy
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DOI：
10.1364/oe.26.020920
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发表时间：
2018-08-06
期刊：
影响因子：
3.8
通讯作者：
So, Peter T. C.
中科院分区：
文献类型：
--
作者：
Xue, Yi;So, Peter T. C.
受激发射耗尽（STED）显微镜能够以纳米级分辨率对荧光标记的样品进行成像。STED显微镜通常是一种点扫描方法，受到耗尽光束的高强度要求的限制。随着高峰功率激光器的发展，二维平行STED显微镜得到了发展。在这里，我们开发的理论基础，扩展STED显微镜三维成像并行。该方法使用结构化照明（SI）来生成三维耗尽图案。与二维平行STED显微镜相比，3D SI-STED显微镜沿着光传播方向产生强度调制，而不需要更高的激光功率。该方法不仅实现了STED显微镜的轴向超分辨率，而且大大减少了三维体积成像的光漂白和光损伤。(c)根据OSA开放获取出版协议的条款，2018年美国光学学会
Stimulated emission depletion (STED) microscopy is able to image fluorescence labeled samples with nanometer scale resolution. STED microscopy is typically a point-scanning method, limited by the high intensity requirement of the depletion beam. With the development of high peak power lasers, two dimensional parallel STED microscopy has been developed. Here, we develop the theoretical basis for extending STED microscopy to three dimensional imaging in parallel. This method uses structured illumination (SI) to generates a three dimensional depletion pattern. Compared to the two dimensional parallel STED microscopy, the 3D SI-STED microscopy generates intensity modulation along the light propagation direction without requiring higher laser power. This method not only achieves axial super-resolution of STED microscopy but also greatly reduces photobleaching and photodamage for 3D volumetric imaging. (c) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement