A note on plating efficiency in fluctuation experiments
A note on plating efficiency in fluctuation experiments
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DOI：
10.1016/j.mbs.2008.09.002
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发表时间：
2008-12-01
影响因子：
4.3
通讯作者：
Zheng, Qi
中科院分区：
文献类型：
--
作者：
Zheng, Qi
在使用Luria-Delbruck实验方案估计突变率时，通常假设所有突变细胞在电镀过程中存活并形成可见的突变菌落。这种完美电镀效率的假设在某些情况下可能不成立，但现有的调整电镀效率的估计方法都不是严格基于似然原理的。为了改善这种情况，我们提出了基于似然的算法来计算突变率的点和区间估计。(C) 2008爱思唯尔公司版权所有。
In estimating mutation rates using the Luria-Delbruck experimental protocol, it is often assumed that all mutant cells survive the plating procedure to form visible mutant colonies. This assumption of perfect plating efficiency may not hold in certain circumstances, but none of the existing estimation methods that adjust for plating efficiency is strictly based on the likelihood principle. To ameliorate this situation, we propose likelihood based algorithms for computing point and interval estimates of mutation rates. (C) 2008 Elsevier Inc. All rights reserved.