Electrical measurement of sediment layer thickness under suspension flows
Electrical measurement of sediment layer thickness under suspension flows
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DOI：
10.1007/s003480050311
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发表时间：
1999-04-01
影响因子：
2.4
通讯作者：
Linden, PF
中科院分区：
文献类型：
--
作者：
de Rooij, F;Dalziel, SB;Linden, PF
本文报道了一种新的技术来测量沉积物层的厚度作为时间的函数，独立于流动条件或悬浮沉积物层上方的存在。底部的小电极和上方流体中的参比电极用于测量具有小AC电流和桥式电路的层的电阻。使用多路复用器和模数转换器，可以在罐底的许多位置准确地监测层的生长。在一个试验中，考察了单分散悬浮液在停滞柱下的沉降。结果表明，沉积物层厚度的变化小于0.3%，可以测量层高达0.2克/厘米（2）。
This paper reports a new technique to measure the thickness of a layer of deposited sediment as a function of time, independent of the flow conditions or presence of suspended sediment above the layer. Small electrodes on the bottom and a reference electrode in the fluid above were used to measure the resistance of the layer with a small AC current and a bridge circuit. Using a multiplexer and an Analog-to-Digital converter the growth of the layer can be accurately monitored at many locations on the tank bottom. In a trial experiment the sedimentation under a stagnant column of a monodisperse suspension was examined. The results show that changes in the sediment layer thickness of less than 0.3% can be measured for layers up to 0.2 g/cm(2).