Moiré interferometry of short wavelength Rayleigh–Taylor growth
Moiré interferometry of short wavelength Rayleigh–Taylor growth
复制标题
短波长瑞利-泰勒生长的莫尔干涉测量
DOI:
10.1063/1.1149434
复制
发表时间:
1999
影响因子:
1.6
通讯作者:
N. Miyanaga
中科院分区:
文献类型:
--
作者:
M. Matsuoka;H. Azechi;M. Nakai;N. Izumi;K. Shigemori;T. Nagaya;N. Miyanaga
One of the most critical quantities to be measured for better understanding of the ablative Rayleigh–Taylor (RT) instability is the cutoff wavelength below which the RT instability is stabilized. Unfortunately, this wavelength is expected to be below or close to spatial resolutions of most x-ray imagers used in the RT experiments. We propose and test a new technique using moire interferometry to convert short wavelength perturbations to longer wavelength perturbations. The RT target is backlit by x rays and imaged just like in conventional experiments, but a grid mask is inserted between the target and the x-ray imager. The grid mask is one dimensional grid with a period slightly different from the wavelength of the RT target. It is set so that the grid and the RT perturbation groove are parallel to each other. With this operation, the long wavelength moire interference is measured as the beat with the RT target. As an initial test, we use a grid mask with 10 μm period coupled to RT targets with 8 and 12 ...