Whole brain, high resolution spin-echo resting state fMRI using PINS multiplexing at 7 T
Whole brain, high resolution spin-echo resting state fMRI using PINS multiplexing at 7 T
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DOI：
10.1016/j.neuroimage.2012.05.080
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发表时间：
2012-09-01
期刊：
影响因子：
5.7
通讯作者：
Norris, David G.
中科院分区：
文献类型：
--
作者：
Koopmans, Peter J.;Boyacioglu, Rasim;Norris, David G.
本文介绍了自旋回波EPI在7T静息状态功能磁共振成像中的应用，通过使用切片多路复用器，实现了1860ms的短重复时间，从而实现了高空间分辨率(84个1.6 mm厚的切片)的全脑覆盖。射频功率沉积通过使用与切片数(引脚)无关的功率技术保持在调节范围内。获得了1.5 mm的面内空间分辨率，同时通过面内并行成像技术改善了图像失真。数据来自6名受试者，每个受试者的测量时间略高于15分钟。集团一级的独立成分(IC)分析揭示了24个非人工事实的静止状态网络，包括那些在标准收购中常见的网络，以及广泛地区的可信网络。信号是从通常由于梯度回波采集中的信号空洞而变得不可访问的区域测量的。使用双重回归获得单个受试者水平的空间IC图，揭示了与采集序列中高度T-2加权一致的对灰质的精确定位。因此，这项技术在7 T(C)2012 Elsevier Inc.的静息状态和激活研究中都具有很大的前景。保留所有权利。
This article demonstrates the application of spin-echo EPI for resting state fMRI at 7 T. A short repetition time of 1860 ms was made possible by the use of slice multiplexing which permitted whole brain coverage at high spatial resolution (84 slices of 1.6 mm thickness). Radiofrequency power deposition was kept within regulatory limits by use of the power independent of number of slices (PINS) technique. A high in-plane spatial resolution of 1.5 mm was obtained, while image distortion was ameliorated by the use of in-plane parallel imaging techniques. Data from six subjects were obtained with a measurement time of just over 15 min per subject. A group level independent component (IC) analysis revealed 24 non-artefactual resting state networks, including those commonly found in standard acquisitions, as well as plausible networks for a broad range of regions. Signal was measured from regions commonly rendered inaccessible due to signal voids in gradient echo acquisitions. Dual regression was used to obtain spatial IC maps at the single subject level revealing exquisite localisation to grey matter that is consistent with a high degree of T-2-weighting in the acquisition sequence. This technique hence holds great promise for both resting state and activation studies at 7 T. (C) 2012 Elsevier Inc. All rights reserved.