Real-Space Determination of Surface Structure by Scanning Tunneling Microscopy
Real-Space Determination of Surface Structure by Scanning Tunneling Microscopy
复制标题
通过扫描隧道显微镜实空间测定表面结构
DOI：
10.1088/0031-8949/1987/t19a/009
复制
发表时间：
1987
期刊：
影响因子：
2.9
通讯作者：
J. Stroscio
中科院分区：
文献类型：
--
作者：
R. Feenstra;J. Stroscio
提出了一种解释表面扫描隧道显微镜（STM）图像的方法，并将该方法应用于Si（111）2 × 1表面。我们演示了STM如何不直接成像表面上的原子。相反，这些图像揭示了位于费米能级附近的电子态的空间分布。对于半导体，给定的波函数通常优先局限于特定的原子或键。因此，图像的最低阶解释需要表面波函数的描述，并且这里示出了用于定性地构造波函数的简单方法。利用这种方法，我们证明了Si（111）2 × 1表面的STM图像符合π键链模型，而不符合π键分子模型和屈曲模型.
We present a method for interpreting scanning tunneling microscope (STM) images of surfaces, and apply this method to the Si(111)2 × 1 surface. We demonstrate how the STM does not directly image the atoms on a surface. Rather, the images reveal the spatial distribution of those electronic states lying near the Fermi-level. For semiconductors, a given wave-function is often preferentially localized on specific atoms or bonds. A lowest order interpretation of the images thus requires a description of the surface wave-functions, and a simple method for qualitatively constructing the wave-functions is illustrated here. Using this method, we demonstrate that STM images of the Si(111)2 × 1 surface are consistent with the π-bonded chain model for this surface, and inconsistent with the π-bonded molecular model and the buckled model.
影响因子：
8.6
作者：
G. Binnig;H. Rohrer;C. Gerber;E. Weibel
通讯作者：
G. Binnig;H. Rohrer;C. Gerber;E. Weibel