Defocus estimation from stroboscopic cryo-electron microscopy data
Defocus estimation from stroboscopic cryo-electron microscopy data
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DOI：
10.1016/j.ultramic.2011.08.007
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发表时间：
2011-11-01
期刊：
影响因子：
2.2
通讯作者：
Ravelli, Raimond B. G.
中科院分区：
文献类型：
--
作者：
Nejadasl, Fatemeh Karimi;Karuppasamy, Manikandan;Ravelli, Raimond B. G.
Defocus estimation is an important step for improving the resolution of single particle reconstructions. It can be troublesome to estimate the defocus from low-dose cryo-electron microscopy (cryo-EM) data, particularly if there is not sufficient contrast present in the Fourier transform of the micrograph. Most existing approaches estimate the defocus from the presence of Thon rings within the power spectrum, employing image enhancement techniques to highlight these rings. In this paper, an approach to estimating the defocus from a stroboscopic image series is described. The image series is used to obtain two statistical metrics: figure of merit (FOM) and Q-factor. These metrics have been used to estimate the defoci from low-dose stroboscopic cryo-EM data consisting of a variable number of images. (C) 2011 Elsevier B.V. All rights reserved.
