Theory of a 4He parametric-resonance magnetometer based on atomic alignment
Theory of a 4He parametric-resonance magnetometer based on atomic alignment
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DOI:
10.1103/physreva.98.053431
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发表时间:
2018-11-26
影响因子:
2.9
通讯作者:
Palacios-Laloy, Agustin
中科院分区:
文献类型:
--
作者:
Beato, Francois;Belorizky, Elie;Palacios-Laloy, Agustin
In parametric-resonancc magnetometers (PRMs), optically pumped atoms subject to rf fields allow one to measure the components of a very low magnetic field. Here, instead of using a circularly polarized light for creating atomic orientation, as in previous works, a linearly polarized light is used for creating atomic alignment. A dressed-atom formalism introduced by Polonsky and Cohen-Tannoudji is extended and allows one to map this situation to a simpler Hanle effect on aligned atoms. Analytical expressions for all alignment tensor components and photodetection signals are obtained for both the Hanle magnetometer and PRMs. A two-rf field alignment PRM is shown to display several improvements from its orientation counterpart, providing a secular third axis sensitivity and a lower degradation from the one-axis sensitivity obtained by using a single rf field. These specificities are shown to result from the apparent depolarization of the pumping light acting on the atom dressed by two-rf fields. Experimental measurements showing a good agreement with the theoretical predictions are presented.