In Situ X-ray diffraction studies of electrode solution interfaces
In Situ X-ray diffraction studies of electrode solution interfaces
复制标题
电极溶液界面的原位 X 射线衍射研究
DOI：
10.1016/0013-4686(86)80002-0
复制
发表时间：
1986
影响因子：
6.6
通讯作者：
J. Robinson
中科院分区：
文献类型：
--
作者：
M. Fleischmann;A. Oliver;J. Robinson
描述了一种利用位置敏感光子计数技术的计算机控制的X射线衍射系统，该系统能够原位研究固/液界面的结构，特别是电极和电解质溶液之间的结构。讨论了该技术在研究碘在石墨上的吸附、镍电极上氢化物的形成、氢氧化镍和氢氧化物的电化学转化以及银电极上铅的欠电位沉积引起的结构变化等方面的应用。
A computer controlled X-ray diffraction system utilizing position sensitive photon counting techniques that is capable of investigating,in situ, structure at the solid/liquid interface, particularly that between an electrode and an electrolyte solution, is described. The application of this technique to the study of iodine adsorption on graphite, hydride formation at nickel electrodes, the electrochemical interconversion of nickel hydroxides and oxyhydroxides and the structural changes accompanying lead underpotential deposition on silver electrodes is discussed.