Variation of the oxidation rate of silicon carbide with water-vapor pressure
Variation of the oxidation rate of silicon carbide with water-vapor pressure
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DOI:
10.1111/j.1151-2916.1999.tb01810.x
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发表时间:
1999-03-01
影响因子:
3.9
通讯作者:
Opila, EJ
中科院分区:
文献类型:
--
作者:
Opila, EJ
Chemically vapor deposited silicon carbide (CVD SiC) was oxidized at temperatures of 1000 degrees-1400 degrees C in H2O/O-2 gas mixtures with compositions of 10-90 vol% water vapor at a total pressure of 1 atm. Additional experiments were conducted in H2O/argon mixtures at a temperature of 1100 degrees C. Experiments were designed to minimize impurity and volatility effects, so that only intrinsic water-vapor effects were observed. The oxidation kinetics increased as the water-vapor content increased. The parabolic oxidation rates in the range of 10-90 vol% water vapor (the balance being oxygen) were approximately one order of magnitude higher than the rates that were observed in dry oxygen for temperatures of 1200 degrees-1400 degrees C. The power-law dependence of the parabolic oxidation rate on the partial pressure of water vapor at all temperatures of the study indicated that the molecular species was not the sole rate-limiting oxidant. The determination of an activation energy for diffusion was complicated by variations in the oxidation mechanism and oxide-scale morphology with the partial pressure of water vapor and the temperature.